11 results
Automation of TEM Alignment using Python Scripting
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- Journal:
- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2998-2999
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- August 2022
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Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
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- Journal:
- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2634-2635
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- August 2022
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Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis
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- Journal:
- / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2200-2201
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- August 2022
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Development of Ultrahigh Resolution Objective Lens Enabling High Analytical Sensitivity
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3126-3128
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- August 2020
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Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3110-3111
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- August 2020
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Controlling Depth Resolution of Phase Images by Ptychography using Achromatic Condition
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 222-224
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- August 2020
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Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1996-1997
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- August 2019
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Improvement of Spatial Resolution in Z Direction with Improved Energy Spread Measured using Aberration Corrected STEM with Cold Field Emission Gun
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 514-515
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- August 2019
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Investigation of Image Contrast in Biological Samples by Pixelated STEM Detector
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- Journal:
- / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1694-1695
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- August 2019
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Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun
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- Journal:
- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 128-129
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- August 2018
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Low Dose Imaging by STEM Ptychography Using Pixelated STEM Detector
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- Journal:
- / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 198-199
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- August 2018
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