20 results
Non-contact C-V measurements of ultra thin dielectrics
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 495-498
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- July 2004
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Mapping of minority carrier diffusion length and heavy metal contamination with ultimate surface photovoltage method
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- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 503-506
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- July 2004
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SPV Monitoring of Near Surface Doping – Role of Boron-Hydrogen Interaction; Boron Passivation and Reactivation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 669 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, J2.5
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- 2001
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Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 591 / 1999
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- 10 February 2011, 225
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- 1999
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Study of Stress-Induced Leakage Current in Thin Oxides Stressed by Corona Charging in Air: Relationship to GOI Defects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 592 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 345
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- 1999
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Improvement of Poly-Silicon Thin Films and Thin Film Transistors Using Ultrasound Treatment
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- Journal:
- MRS Online Proceedings Library Archive / Volume 424 / 1996
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- 10 February 2011, 201
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- 1996
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A Novel Method For Studying Degradation Related To Plasma Processing Of Silicon Wafers
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 437
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- 1996
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A New, Real-Time Method for Measuring Mobile Charge and Injected Charge in SiO2 on Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
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- 15 February 2011, 443
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- 1996
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Enhanced Hydrogenation Due to Ultrasound Treatment in Polycrystalline Silicon: New Approach to Thin Film Defect Engineering
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- MRS Online Proceedings Library Archive / Volume 378 / 1995
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- 26 February 2011, 405
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- 1995
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Large Persistent Photochromic Effect Due to DX Centers in AlSb Doped with Selenium
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- Journal:
- MRS Online Proceedings Library Archive / Volume 378 / 1995
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- 26 February 2011, 47
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- 1995
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Effect of Rapid Thermal Oxidation on Blue and Red Luminescence Bands of Porous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
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- 28 February 2011, 369
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- 1994
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Surface Photovoltage Measurement of Minority Carrier Diffusion Lengths Exceeding Wafer Thickness: Application to Iron Monitoring with Part Per Quadrillion Sensitivity
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- MRS Online Proceedings Library Archive / Volume 324 / 1993
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- 22 February 2011, 439
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- 1993
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Microscopic Analysis of the Behavior of Interstitial and Precipitated Oxygen During Intrinsic Gettering in Si
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- MRS Online Proceedings Library Archive / Volume 104 / 1987
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- 26 February 2011, 205
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- 1987
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On the Mechanism of Intrinsic Gettering by Butterfly-Type Defects in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 71 / 1986
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- 28 February 2011, 21
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- 1986
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EL2 and Related Defects in GaAs--Challenges and Pitfalls
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- MRS Online Proceedings Library Archive / Volume 46 / 1985
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- 28 February 2011, 153
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- 1985
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EBIC Spectroscopy - A New Approach to Microscale Characterization of Deep Levels in Semi-Insulating GaAs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
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- 28 February 2011, 441
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- 1985
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High Resolution Optical Study of The Antisite Defect ASGa in GaAs; Correlation with Midgap Level EL2
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- MRS Online Proceedings Library Archive / Volume 46 / 1985
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- 28 February 2011, 207
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- 1985
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Scattering of Free Carriers by Oxide Precipitates in Czochralski-Grown Silicon
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- MRS Online Proceedings Library Archive / Volume 46 / 1985
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- 28 February 2011, 291
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- 1985
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Intrinsic Gettering in Oxygen-Free Silicon
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- MRS Online Proceedings Library Archive / Volume 36 / 1984
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- 21 February 2011, 175
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- 1984
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Correlation of Oxygen and Recombination Centers on a Microscale in Asgrown Czochralski Silicon Crystals
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- MRS Online Proceedings Library Archive / Volume 14 / 1982
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- 15 February 2011, 177
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- 1982
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