11 results
Coupling Between Precipitation and Plastic Deformation DuringElectromigration in a Passivated Al (0.5wt%Cu) Interconnect
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- Journal:
- MRS Online Proceedings Library Archive / Volume 812 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, F7.4
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- 2004
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Quantitative Characterization of Dislocation Structure coupled with Electromigration in a Passivated Al (0.5wt%Cu) Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E1.2
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- 2003
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Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction
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- Journal:
- MRS Online Proceedings Library Archive / Volume 673 / 2001
- Published online by Cambridge University Press:
- 18 March 2011, P7.7
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- 2001
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Observations of Low Cycle Fatigue of Al Thin Films for Mems Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 518 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 81
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- 1998
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A Simple Analysis of Average Mechanical Behavior and Strain Energy Density of Misoriented Grains in a Textured Film
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 97
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- 1995
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The Effects of Processing on the Microstructure of Copper Thin Films on Tantalum Barrier Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 303
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- 1995
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In Situ Observations of Voiding in Metal Lines Under Passivation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 409
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- 1994
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Thermal Stresses in Passivated Copper Interconnects Determined by X-Ray Analysis and Finite Element Modeling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 289
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- 1994
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Synthesis and Properties of Ultra-Thin YBa2Cu3O7 and YBa2Cu3O7/La2-xSrxCuO4 Multilayers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 169 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 557
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- 1989
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A High Resolution Cross-Section Transmission Electron Microscopy Study of Epitaxial rare Earth Fluoride / GaAs(111) Interfaces Prepared by Molecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 160 / 1989
- Published online by Cambridge University Press:
- 28 February 2011, 513
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- 1989
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The Morphology of the Polysilicon - SiO2 Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 25 / 1983
- Published online by Cambridge University Press:
- 22 February 2011, 311
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- 1983
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