In recognition of an increasing number of high-consequence infectious disease events, a group of subject-matter experts identified core safety principles that can be applied across all donning and doffing protocols for personal protective equipment.

Electron microprobe trace element analysis is a significant challenge. Due to the low net intensity of peak measurements, the accuracy and precision of such analyses relies critically on background measurements, and on the accuracy of any pertinent peak interference corrections. A linear regression between two points selected at appropriate background positions is a classical approach for electron probe microanalysis (EPMA). However, this approach neglects the accurate assessment of background curvature (exponential or polynomial), and the presence of background interferences, a hole in the background, or an absorption edge can dramatically affect the results if underestimated or ignored. The acquisition of a quantitative wavelength-dispersive spectrometry (WDS) scan over the spectral region of interest remains a reasonable option to determine the background intensity and curvature from a fitted regression of background portions of the scan, but this technique can be time consuming and retains an element of subjectivity, as the analyst has to select areas in the scan which appear to represent background. This paper presents a new multi-point background (MPB) method whereby the background intensity is determined from up to 24 background measurements from wavelength positions on either side of analytical lines. This method improves the accuracy and precision of trace element analysis in a complex matrix through careful regression of the background shape, and can be used to characterize the background over a large spectral region covering several elements to be analyzed. The overall efficiency improves as systematic WDS scanning is not required to assess background interferences. The method is less subjective compared to methods that rely on WDS scanning, including selection of two interpolation points based on WDS scans, because “true” backgrounds are selected through an exclusion method of possible erroneous backgrounds. The first validation of the MPB method involves blank testing to ensure the method can accurately measure the absence of an element. The second validation involves the analysis of U-Th-Pb in several monazite reference materials of known isotopic age. The impetus for the MPB method came from efforts to refine EPMA monazite U-Th-Pb dating, where it was recognized that background errors resulting from interference or strong background curvature could result in errors of several tens of millions of years on the calculated date. Results obtained on monazite reference materials using two different microprobes, a Cameca SX-100 Ultrachron and a JEOL JXA-8230, yield excellent agreement with ages obtained by isotopic methods (Thermal Ionization Mass Spectrometry [TIMS], Sensitive High-Resolution Ion MicroProbe [SHRIMP], or Secondary Ion Mass Spectrometry [SIMS]). Finally, the MPB method can be used to model the background over a large spectrometer range to improve the accuracy of background measurement of minor and trace elements acquired on a same spectrometer, a method called the shared background measurement. This latter significantly improves the accuracy of minor and trace element analysis in complex matrices, as demonstrated by the analysis of Rare Earth Elements (REE) in REE-silicates and phosphates and of trace elements in scheelite.

Secondary fluorescence (SF), typically a minor error in routine electron probe microanalysis (EPMA), may not be negligible when performing high precision trace element analyses in multiphase samples. Other factors, notably wavelength dispersive spectrometer defocusing, may introduce analytical artifacts. To explore these issues, we measured EPMA transects across two material couples chosen for their high fluorescence yield. We measured transects away from the fluorescent phase, and at various orientations with respect to the spectrometer focal line. Compared to calculations using both the Monte Carlo simulation code PENEPMA and the semi-analytical model FANAL, both codes estimate the magnitude of SF, but accurate correction requires knowledge of the position of the spectrometer with respect to the couple interface. Positioned over the fluorescent phase or otherwise results in a factor of 1.2–1.8 of apparent change in SF yield. SF and spectrometer defocusing may introduce systematic errors into trace element analyses, both may be adequately accounted for by modeling. Of the two, however, SF is the dominant error, resulting in 0.1 wt% Zn apparently present in Al at 100 μm away from the Zn boundary in an Al/Zn couple. Of this, around 200 ppm Zn can be attributed to spectrometer defocusing.

We report the discovery in the Greenland ice sheet of a discrete layer of free nanodiamonds (NDs) in very high abundances, implying most likely either an unprecedented influx of extraterrestrial (ET) material or a cosmic impact event that occurred after the last glacial episode. From that layer, we extracted n-diamonds and hexagonal diamonds (lonsdaleite), an accepted ET impact indicator, at abundances of up to about 5×106 times background levels in adjacent younger and older ice. The NDs in the concentrated layer are rounded, suggesting they most likely formed during a cosmic impact through some process similar to carbon-vapor deposition or high-explosive detonation. This morphology has not been reported previously in cosmic material, but has been observed in terrestrial impact material. This is the first highly enriched, discrete layer of NDs observed in glacial ice anywhere, and its presence indicates that ice caps are important archives of ET events of varying magnitudes. Using a preliminary ice chronology based on oxygen isotopes and dust stratigraphy, the ND-rich layer appears to be coeval with ND abundance peaks reported at numerous North American sites in a sedimentary layer, the Younger Dryas boundary layer (YDB), dating to 12.9 ± 0.1 ka. However, more investigation is needed to confirm this association.

This paper reports an experimental investigation of the instantaneous structure of a supersonic turbulent boundary layer (M = 2.86, Reθ = 82000) over a short region of longitudinal concave surface curvature. The radius of curvature was 12 initial boundary-layer thicknesses and the turning angle was 16°. Severe distortion of the boundary layer occurred, as evidenced by an alteration of the mean velocity profiles and an increase in wall shear stress of 125%. The large-scale organized motions in the boundary layer were significantly altered as illustrated by changes in the character of the mass flux ‘fronts’ (large gradients in the fluctuating streamwise mass flux).

Experimental results are presented that reveal key features of the large-scale organized structures in a supersonic, turbulent boundary layer. Measurements were obtained in a Mach 3 zero-pressure-gradient boundary layer using a crossed-wire probe and arrays of normal hot wires with vertical, spanwise, and streamwise separations ranging from 0.1 to 0.6δ. Space–time correlation results indicate the existence of large-scale structures of a size comparable to δ, with a spanwise extent only slightly less than the vertical scale. The convection velocity of the large-scale motions is nearly constant across 80% of the boundary layer and is equal to approximately 0.9U∞.

It is shown that positive events detected with the VITA conditional sampling technique correspond to steep gradients in the streamwise mass flux which extend across most of the boundary layer. These sharp gradients appear to be the upstream interfaces of large-scale turbulent ‘bulges’, similar to those seen in incompressible boundary layers. In a reference frame moving with the convection speed of the sharp gradients, low-momentum fluid is observed rotating on a large-scale, while high-momentum fluid forms a saddle point on the upstream edge of the large-scale motion. These motions are associated with elevated levels of the shear product, emphasizing their role in the dynamics of the boundary layer.

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

We present high-precision measurements of pure element stable isotope pairs that demonstrate mass has no influence on the backscattering of electrons at typical electron microprobe energies. The traditional prediction of average backscatter intensities in compounds was pragmatically based on elemental mass fractions. Our isotopic measurements establish that this approximation has no physical basis. We propose an alternative model to mass fraction averaging, based on the number of electrons or protons, termed “electron fraction,” which predicts backscatter yield better than mass fraction averaging. We also present an improved backscatter (electron loss) factor based on a modified electron fraction average for the ZAF atomic number correction that provides a significant analytical improvement, especially where large atomic number corrections are required.

We find no physical basis for traditional mass-fraction weighted averaging of X-ray continuum measured in pure elements to estimate continuum production from compounds. Measurements of continuum from pairs of stable isotopes demonstrate that mass alone (the presence of more or fewer neutrons) has no effect on continuum production in electron probe microanalysis. Electron-fraction weighted averaging, which is based on the relative contribution of each constituent element to the electron (or proton) composition of a compound, proved superior to mass-fraction weighted averaging, in predicting the continuum of a compound from the measured continuum of its elements.

The effect of layered-silicates on the mechanical response of intercalated polycarbonate (PC) nanocomposites subjected to quasi-static tensile, compressive and ballistic impact testing conditions has been investigated. These nanocomposites were melt-processed, in which good dispersion of nanoclays and adequate adhesive bonding between the nanoclay and PC matrix are achieved. However, their ductility upon tensile loading is significantly affected; a transition from ductile to brittle deformation occurs at clay loading of about 3 wt.%. Stress whitening is evident in the tensile- and ballistic-tested 1.5, 2.5, and 3.5 wt.% clay nanocomposites, and is attributed to the light scattering by microvoids, which are presumably formed from either crazing of PC or debonding of the nanoclay tactoids upon mechanical deformation. The effect of clay loading on the ballistic impact strength of the monolithic PC nanocomposites and layered PC/PC-nano/PC composites is determined. Compressive yield strength measurements are obtained at strain rate of 0.001/s for the monolithic PC nanocomposites and are utilized to correlate with the ballistic impact strength of the layered PC/PC-nano/PC composites. Thermal degradation is noted in these PC nanocomposites, and its effect on the mechanical deformation is briefly discussed.