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The rapid advance and falling costs of computing power and data storage during the last 40 years have greatly enhanced the data reduction speed and analytical capacity of energy dispersive spectroscopy (EDS) systems. At the same time, the solid state X-ray detector [until recently, the Si(Li) diode] has seen performance increases due to the use of advanced materials and processing techniques. In addition, the performance of the electronic components (field effect transistor, preamp, and pulse processor) of an EDS system has been constantly improved. These technology advances have resulted in improved spectral quality, excellent light element detection, and increased count rate performance. The results have been truly remarkable and driven by the needs of the analyst. This article will summarize the progress made in these areas in the last 40 years and make a brief reference to prospects for future development in EDS system performance.
The Cosmic Evolution Survey (COSMOS) is an HST/ACS imaging survey of 2 square degrees centered on RA = 10:00:28.6, Dec = + 02:12:21 (J2000). While the primary goal of the survey is to study evolution of galaxy morphology and large scale structure, an extensive multi-wavelength data set allows for a sensitive survey of AGN. Spectroscopy of optical counterparts to faint X-ray and radio sources is being carried out with the Magallen (Baade) Telescope and the ESO VLT. By achieving ∼80 redshift completeness down to I AB = 3, the eventual yield of AGN will be ∼1100 over the whole field.
Early results on supermassive black holes are described. The goals of the survey include a bolometric census of AGN down to moderate luminosities, the cosmic evolution and fueling history of the central engines, and a study of AGN environments on scales ranging from the host galaxy to clusters and superclusters.
As part of the Microbeam Analysis Society (MAS) symposium marking 50 years of electron microprobe analysis, this article reviews the important advances made over the decades to the automation of data collection and computerized analysis of data from the electron microprobe. Out of many innovations that contributed to the advance of microprobe automation, we have chosen to focus on a few developments that the authors feel represent the major trends in advancement of the “state of the art” of this instrumentation. After providing brief summaries of the three generations of advances in the hardware and software of automation systems, several key applications developments are described, followed by our prediction of which current developments may impact the future automation of the microprobe.
X-ray optics have been used in X-ray analytical instruments for
several years. Applications of X-ray optics have been reported in X-ray
diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy.
X-ray optics have been used to increase the X-ray flux incident on the
sample or to direct and focus emitted X-rays from a sample. We report here
the use of a grazing incidence optic (GIO) as a flux-enhancing collimator
for use with an energy-dispersive (ED) detector used to perform electron
beam microanalysis. We found that the GIO in combination with an ED
spectrometer (EDS) provides substantial intensity gain for X-ray lines
with energy below 1 keV. The GIO is also found to provide a modest focus
effect, and introduces minimal spectral artifacts.
This issue of Microscopy and Microanalysis contains a selection
of invited papers from the topical symposium, Thirty Years of
Energy-Dispersive Spectrometry in Microanalysis, sponsored by the
Microbeam Analysis Society (MAS) at the Microscopy & Microanalysis
(M&M) '98 meeting, held July 12-16 in Atlanta, Georgia. This was
the second MAS topical symposium held in conjunction with the annual
M&M meetings, the first being at the meeting in Minneapolis,
Minnesota, in 1996. The MAS topical symposia are part of an initiative to
provide venues for in-depth study of topics of special interest to the
microbeam analysis community. The next MAS topical symposium is planned as
part of M&M '99 and will celebrate Fifty Years of the Electron
Microprobe.
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