27 results
12 - Occupational Stress and Well-Being
- from Part IV - Workplace Interventions Addressing Stress and Well-Being
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- Organizational Stress and Well-Being
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- 23 February 2023
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- 02 March 2023, pp 389-417
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A Three-Dimensional Reconstruction Algorithm for Scanning Transmission Electron Microscopy Data from a Single Sample Orientation
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- / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 24 June 2022, pp. 1632-1640
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- October 2022
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A Method for High-Resolution Three-Dimensional Reconstruction with Ewald Sphere Curvature Correction from Transmission Electron Images
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- / Volume 28 / Issue 5 / October 2022
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- 29 April 2022, pp. 1550-1566
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- October 2022
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Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
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- / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 27 July 2021, pp. 744-757
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- August 2021
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Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale
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- / Volume 27 / Issue 3 / June 2021
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- 12 April 2021, pp. 528-542
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- June 2021
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Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
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- / Volume 26 / Issue 6 / December 2020
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- 16 November 2020, pp. 1147-1157
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- December 2020
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Atomically Resolved Vibrational Spectroscopy in the Electron Microscope
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 592-593
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- August 2019
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Pushing the Limits of Absolute Scale Energy Dispersive X-ray Quantification
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- / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 968-969
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- August 2019
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Probing the Effects of Electron Channelling on EDX Quantification
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 392-393
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- July 2017
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Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.
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- / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 464-465
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- July 2017
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Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
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- / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 1430-1431
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- July 2016
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Facilitating Quantitative Analysis of Atomic Scale 4D STEM Datasets
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- / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 474-475
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- July 2016
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Inversion of STEM EELS Data to Obtain Site Occupancy and Near Edge Structure
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 2251-2252
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- August 2015
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Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 819-820
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- August 2015
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Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1079-1080
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- August 2015
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Accurate Nanoscale Crystallography in Real-Space Using Scanning Transmission Electron Microscopy
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- / Volume 21 / Issue 4 / August 2015
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- 14 July 2015, pp. 946-952
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- August 2015
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Contributors
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- Silverberg's Principles and Practice of Surgical Pathology and Cytopathology
- Published online:
- 13 March 2015
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- 26 March 2015, pp vii-x
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Understanding B-Site Disorder in HAADF-STEM Images of Double Perovskite Thin Films Using the Quantum Excitation of Phonons Model
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- / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 184-185
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- August 2014
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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
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- / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 376-377
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- August 2014
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Characterizing Sub-lattice Occupancies in B2 Phases in High Entropy Metallic Alloys using Atomic Resolution STEM-XEDS Mapping
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- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 116-117
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- August 2014
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