The transformation of unstable austenite to ferrite or α′ martensite as a result of exposure to Xe+ or Ga+ ions at room temperature was studied in a 304 stainless steel casting alloy. Controlled Xe+ and Ga+ ion beam exposures of the 304 were carried out at a variety of beam/sample geometries. It was found that both Ga+ and Xe+ ion irradiation resulted in the transformation of the austenite to either ferrite or α′ martensite. In this paper, we will refer to the transformation product as a BCC phase. The crystallographic orientation of the transformed area was controlled by the orientation of the austenite grain and was consistent with either the Nishiyama–Wasserman or the Kurdjumov–Sachs orientation relationships. On the basis of the Xe+ and Ga+ ion beam exposures, the transformation is not controlled by the chemical stabilization of the BCC phase by the ion species, but is a result of the disorder caused by the ion-induced recoil motion and subsequent return of the disordered region to a more energetically favorable phase.

The capability to perform liquid in situ transmission electron microscopy (TEM) experiments provides an unprecedented opportunity to examine the real-time processes of physical and chemical/electrochemical reactions during the interaction between metal surfaces and liquid environments. This work describes the requisite steps to make the technique fully analytical, from sample preparation, through modifications of the electrodes, characterization of electrolytes, and finally to electrochemical corrosion experiments comparing in situ TEM to conventional bulk cell and microcell configurations.

In recent years, an increasing number of studies utilizing in situ liquid and/or gaseous cell scanning/transmission electron microscopy (S/TEM) have been reported. Because of the difficulty in the preparation of suitable specimens, these environmental S/TEM studies have been generally limited to studies of nanoscale structured materials such as nanoparticles, nanowires, or sputtered thin films. In this paper, we present two methodologies which have been developed to facilitate the preparation of electron-transparent samples from conventional bulk metals and alloys for in situ liquid/gaseous cell S/TEM experiments. These methods take advantage of combining sequential electrochemical jet polishing followed by focused ion beam extraction techniques to create large electron-transparent areas for site-specific observation. As an example, we illustrate the application of this methodology for the preparation of in situ specimens from a cold-rolled Type 304 austenitic stainless steel sample, which was subsequently examined in both 1 atm of air as well as fully immersed in a H2O environment in the S/TEM followed by hyperspectral imaging. These preparation techniques can be successfully applied as a general procedure for a wide range of metals and alloys, and are suitable for a variety of in situ analytical S/TEM studies in both aqueous and gaseous environments.

The use of analytical spectroscopies during scanning/transmission electron microscope (S/TEM) investigations of micro- and nano-scale structures has become a routine technique in the arsenal of tools available to today’s materials researchers. Essential to implementation and successful application of spectroscopy to characterization is the integration of numerous technologies, which include electron optics, specimen holders, and associated detectors. While this combination has been achieved in many instrument configurations, the integration of X-ray energy-dispersive spectroscopy and in situ liquid environmental cells in the S/TEM has to date been elusive. In this work we present the successful incorporation/modifications to a system that achieves this functionality for analytical electron microscopy.

Aloha! On behalf of the Microscopy Society of America (MSA), the Microbeam Analysis Society (MAS), the International Metallographic Society (IMS), the Australian Microscopy and Microanalysis Society (AMMS, Inc.), the Australian Microbeam Analysis Society (AMAS), Microscopy New Zealand (MNZ), and the Committee of Asia-Pacific Societies for Microscopy (CAPSM), we welcome members of microscopy and microanalysis societies throughout the world, and particularly those in the Pacific Rim, to our jointly-sponsored international Microscopy and Microanalysis 2005 meeting in Honolulu, Hawaii, scheduled for July 31–August 4, 2005. The Program Committee, chaired by Bob Price, has already arranged an interesting series of symposia and tutorials, including sessions on pathology, microorganisms, macromolecules, nanotechnology, instrumentation, materials characterization, microanalytical techniques, focused ion beam, and advances in microscopy. There will also be a special Presidential Symposium, “The Golden Anniversary of Imaging Atoms,” to commemorate the 50th anniversary of the first images of atoms obtained using field-ion microscopy by Müller and Bahadur. Of course, an essential aspect of the technical program is your vital contributed paper! There are great reasons to arrive early for M&M 2005. Besides the outstanding technical programming for M&M 2005, there will be an excellent Pre-Meeting Congress and a series of topical one-day courses providing a perfect way to acclimatize to the local time zone! Our venue in Honolulu will be all the more enjoyable thanks to the dedication and hard work of the M&M 2005 local arrangements committee, co-chaired by Tina Carvalho and Marilyn Dunlap. A fabulous opening reception on the lawn of the Sheraton Waikiki will be held on July 31, 2005 to welcome you. The Hawaii Convention Center will be our venue for technical symposia, short courses, and the commercial exhibition, with plenty of space for meeting new colleagues and renewing acquaintances. Our Sustaining Members and Exhibitors are committed to making the Commercial Exhibition a must-see event, and a great opportunity to examine new instrumentation in a unique setting. Microscopy and Microanalysis 2005 promises to be an exciting international scientific meeting in a most delightful venue. We look forward to seeing you in Honolulu!

Message from the President and lists of MSA council members, MSA appointed officers, MSA sustaining members, and MSA awards and award winners.