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35 results

Page 1 of 2

  • Valence Electron States of Carbon Materials studied by TEM-SXES

  • M. Terauchi
  • Journal:
    / Volume 20 / Issue S3 / August 2014
    Published online by Cambridge University Press:
    27 August 2014, pp. 896-897
    Print publication:
    August 2014
    • Article
      • You have access
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  • Construction of a SXES spectrometer for a conventional SEM

  • M. Terauchi, S. Koshiya, F. Satoh, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto
  • Journal:
    / Volume 19 / Issue S2 / August 2013
    Published online by Cambridge University Press:
    09 October 2013, pp. 1278-1279
    Print publication:
    August 2013
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • High Energy-Resolution EELS and SXES Studies on Characteristic Chemical Shifts and Charge Transfer in Al-Si-Mn and Zn-Mg-Zr Alloys

  • S Koshiya, M Terauchi, S Ohhashi, A Tsai
  • Journal:
    / Volume 17 / Issue S2 / July 2011
    Published online by Cambridge University Press:
    08 April 2017, pp. 1884-1885
    Print publication:
    July 2011
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument

  • M Terauchi, H Takahashi, N Handa, T Murano, M Koike, T Kawachi, T Imazono, M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto
  • Journal:
    / Volume 16 / Issue S2 / July 2010
    Published online by Cambridge University Press:
    01 August 2010, pp. 1308-1309
    Print publication:
    July 2010
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Development of TEM-SXES instruments for valence electron spectroscopy

  • M Terauchi
  • Journal:
    / Volume 15 / Issue S2 / July 2009
    Published online by Cambridge University Press:
    26 July 2009, pp. 214-215
    Print publication:
    July 2009
    • Article
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 1 of 2