12 results
Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't
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- Journal:
- / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 442-443
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- August 2020
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Making every electron count: materials characterization by quantitative analytical scanning transmission electron microscopy
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- / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1430-1431
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- July 2016
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Facilitating Quantitative Analysis of Atomic Scale 4D STEM Datasets
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- / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 474-475
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- July 2016
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Role of Interface Structure and Chemistry in Resistive Switching of NiO Nanocrystals on SrTiO3
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 781-782
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- August 2015
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Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 819-820
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- August 2015
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Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy
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- / Volume 21 / Issue S3 / August 2015
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- 23 September 2015, pp. 1079-1080
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- August 2015
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Frontiers of Electron Microscopy in Materials Science
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- / Volume 20 / Issue 4 / August 2014
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- 04 July 2014, pp. 999-1000
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- August 2014
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Microstructural Characterization of an Al-Li-Mg-Cu Alloy by Correlative Electron Tomography and Atom Probe Tomography
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- / Volume 20 / Issue 4 / August 2014
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- 12 May 2014, pp. 1022-1028
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- August 2014
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STEM Electron Tomography for Nanoscale Materials Science
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- / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 148-149
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- August 2004
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Analyzing the 3-D Structural Properties of Quantum Dots
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- / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 1192-1193
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- August 2004
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Structural Elucidation of Pt-Ru Heterogeneous Catalysts by Electron Tomography
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- / Volume 10 / Issue S02 / August 2004
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- 01 August 2004, pp. 34-35
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- August 2004
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Extending Energy-Filtered Transmission Electron Microscopy (EFTEM) into Three Dimensions Using Electron Tomography
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- / Volume 9 / Issue 6 / December 2003
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- 21 November 2003, pp. 542-555
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- December 2003
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