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Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source
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- Journal:
- / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 208-209
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- August 2018
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Information-tagged Data-acquisition System for On-the-fly Scanning
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- Journal:
- / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 104-105
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- August 2018
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Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
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- / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 430-431
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- August 2018
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Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source
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- / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 198-199
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- August 2018
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Spectral Sensitivities of X-Ray Diffraction to the Roughness of Si/SiO2 Interfaces
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- MRS Online Proceedings Library Archive / Volume 399 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 531
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- 1995
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Spectral Sensitivities of X-Ray Diffraction and Atomic Force Microscopy to the Roughness of Si/SiO2 Interfaces
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- MRS Online Proceedings Library Archive / Volume 355 / 1994
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- 21 February 2011, 373
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- 1994
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A Comparison of The Roughness of Various Si/SiO2 Interfaces Using Synchrotron X-Ray Diffraction
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- MRS Online Proceedings Library Archive / Volume 315 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 399
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- 1993
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