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During the first five years of the twenty-first century the Howard Government took on a more activist role in the South Pacific. This trend was influenced by the ‘war on terror’, particularly the Bali bombings, which struck home in a manner that the 11 September attacks could not, but it also firmly reflected policy orthodoxies. This is not to say that responding to terrorism closer to home has not become a justification for intervention in the region, but it must be acknowledged that declaratory policy was not always matched by operational realities. The ‘war on terror’ opened up the political space in which increased intervention in the South Pacific could be undertaken, but events within the region itself were the central factor contributing to intervention. In particular, domestic crises in Solomon Islands and Papua New Guinea, and to a lesser extent Nauru, presented major challenges for Australia, and the creation and maintenance of an environment conducive to intervention was a significant foreign policy shift by the government.
This paper examines the privatisation of Sydney Airport and the regime of ‘light-handed’ monitoring of service quality and airport charges that followed the sale in 2002. The arguments for privatisation are reviewed, in particular the need for increased competition and/or appropriate regulation where a former public monopoly, such as Sydney Airport, is sold. The aftermath of the privatisation of the airport has led to complaints by the major airlines and consumers of ever increasing charges for use of the airfield and for car parking and other services. This highlights that the ‘light-handed’ monitoring regime has not constrained the airport’s ability to charge monopoly rents. The aftermath of privatisation has resulted in labour shedding, outsourcing and a focus on cost minimisation by the airport’s management.
This one-day pre-meeting congress, organized by the MSA Aberration-Corrected Electron Microscopy (ACEM) FIG, will be a forum for the discussion of the latest advances and solutions to problems associated with application of aberration correction technology. There will be platform presentations by both invited and contributed speakers, with poster presentations during a working lunch. Invited speakers will introduce innovations and issues, while contributors will highlight practical experiences and solutions to problems encountered during the application of ACEM to on-going experimental studies. This workshop includes: image collection/interpretation, new spectroscopies or other signals, artifacts and practical experiences in applications of ACEM to difficult situations such as hard/soft materials and in-situ experiments. All platform presentations will be intentionally kept short (∼15–20 minutes) to allow the maximum amount of interaction and information flow among attendees. Please send one page abstracts, including figures, to batson@rutgers.edu with the subject line: M&M PMC Abstract.
Coding standards and good practices are fundamental to a disciplined approach to software projects irrespective of programing languages being employed. Prolog programing can benefit from such an approach, perhaps more than programing in other languages. Despite this, no widely accepted standards and practices seem to have emerged till now. The present paper is a first step toward filling this void: It provides immediate guidelines for code layout, naming conventions, documentation, proper use of Prolog features, program development, debugging, and testing. Presented with each guideline is its rationale and, where sensible options exist, illustrations of the relative pros and cons for each alternative. A coding standard should always be selected on a per-project basis, based on a host of issues pertinent to any given programing project; for this reason the paper goes beyond the mere provision of normative guidelines by discussing key factors and important criteria that should be taken into account when deciding on a full-fledged coding standard for the project.
The resolution-limiting aberrations of round electromagnetic lenses
can now be successfully overcome via the use of multipole element
“aberration correctors.” The installation and performance of a
hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side
of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the
microscope not to be severely compromised by its environment, a new,
specially designed building at Oak Ridge National Laboratory has been
built. The Advanced Microscopy Laboratory was designed with the goal of
providing a suitable location for aberration-corrected electron
microscopes. Construction methods and performance of the building are
discussed in the context of the performance of the microscope. Initial
performance of the microscope on relevant specimens and modifications made
to eliminate resolution-limiting conditions are also discussed.
Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
A recent article in these pages compares STEM images with an image
obtained with the One-Ångstrom Microscope (OÅM) at Lawrence
Berkeley National Laboratory (LBNL). Although the experimental work is
of excellent quality, Diebold et al. (2003)
offer an incorrect explanation of the image formation process in the
high-resolution transmission electron microscope. It is important that
this misinterpretation be corrected before it comes to be accepted as
factual by other scientists who are not expert in the field of
high-resolution transmission electron microscopy.
Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.
The One-Ångstrom Microscope (OÅM) project was established at the NCEM to produce images at sub-Ångstrom resolution (O'Keefe, 1993). The project was implemented using a Philips CM300FEG/UT with hardware modifications designed to correct objective lens three-fold astigmatism and extend information transfer to 0.8 Ångstrom (O'Keefe et al., 2001a). A Gatan image filter (GIFTM) was used to bring the image magnification to more than three million times at the CCD camera to provide adequate real-space sampling.
Phase-contrast imaging in the HRTEM produces images with peaks at atom positions by extracting the spatial distribution of the relative phase from the electron wave. Usually, the electron wave is imaged by direct interference of diffracted beams at optimum focus (Scherzer, 1949).
Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implementation of microscope sites, from the microscope room to the building that surrounds it. Laboratories have been constructed to house high-sensitive instruments with resolutions ranging down to sub-Angstrom levels; we present the various design philosophies used for some of these laboratories and our experiences with them. Four facilities are described: the National Center for Electron Microscopy OAM Laboratory at LBNL; the FEGTEM Facility at the University of Sheffield; the Center for Integrative Molecular Biosciences at TSRI; and the Advanced Microscopy Laboratory at ORNL.
John Cowley and his group at Arizona State University pioneered the
use of transmission electron microscopy (TEM) for high-resolution
imaging. Three decades ago they achieved images showing the crystal
unit cell content at better than 4 Å resolution. Over the years,
this achievement has inspired improvements in resolution that have
enabled researchers to pinpoint the positions of heavy atom columns
within the cell. More recently, this ability has been extended to light
atoms as resolution has improved. Sub-Ångstrom resolution has
enabled researchers to image the columns of light atoms (carbon,
oxygen, and nitrogen) that are present in many complex structures. By
using sub-Ångstrom focal-series reconstruction of the specimen
exit surface wave to image columns of cobalt, oxygen, and lithium atoms
in a transition metal oxide structure commonly used as positive
electrodes in lithium rechargeable batteries, we show that the range of
detectable light atoms extends to lithium. HRTEM at sub-Ångstrom
resolution will provide the essential role of experimental verification
for the emergent nanotech revolution. Our results foreshadow those to
be expected from next-generation TEMs with CS-corrected
lenses and monochromated electron beams.
We have performed high resolution transmission electron microscope
(HRTEM) image simulations to qualitatively assess the visibility
of various structural defects in ultrathin gate oxides of MOSFET
devices, and to quantitatively examine the accuracy of HRTEM
in performing gate oxide metrology. Structural models contained
crystalline defects embedded in an amorphous 16-Å-thick
gate oxide. Simulated images were calculated for structures
viewed in cross section. Defect visibility was assessed as a
function of specimen thickness and defect morphology, composition,
size, and orientation. Defect morphologies included asperities
lying on the substrate surface, as well as “bridging”
defects connecting the substrate to the gate electrode.
Measurements of gate oxide thickness extracted from simulated
images were compared to actual dimensions in the model structure
to assess TEM accuracy for metrology. The effects of specimen
tilt, specimen thickness, objective lens defocus, and coefficient
of spherical aberration (Cs) on measurement accuracy
were explored for nominal 10-Å gate oxide thickness. Results
from this work suggest that accurate metrology of ultrathin
gate oxides (i.e., limited to several percent error) is feasible
on a consistent basis only by using a Cs-corrected
microscope. However, fundamental limitations remain for
characterizing defects in gate oxides using HRTEM, even with
the new generation of Cs-corrected microscopes.