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36 results

Page 1 of 2

  • Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

  • Chenyu Zhang, Jie Feng, Andrew B. Yankovich, Alexander Kvit, Benjamin Berkels, Paul M. Voyles
  • Journal:
    / Volume 27 / Issue 1 / February 2021
    Published online by Cambridge University Press:
    23 November 2020, pp. 90-98
    Print publication:
    February 2021

  • Achieving sub-picometer precision measurements of atomic column positions in high-resolution scanning transmission electron microscope images using nonrigid registration (NRR) and averaging of image series requires careful optimization of experimental conditions and the parameters of the registration algorithm. On experimental data from SrTiO3 [100], sub-pm precision requires alignment of the sample to the zone axis to within 1 mrad tilt and sample drift of less than 1 nm/min. At fixed total electron dose for the series, precision in the fast scan direction improves with shorter pixel dwell time to the limit of our microscope hardware, but the best precision along the slow scan direction occurs at 6 μs/px dwell time. Within the NRR algorithm, the “smoothness factor” that penalizes large estimated shifts is the most important parameter for sub-pm precision, but in general, the precision of NRR images is robust over a wide range of parameters.

  • Electron Correlation Microscopy for Studying Fluctuating Systems In Situ

  • Debaditya Chatterjee, Pei Zhang, Paul M. Voyles
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 1520-1521
    Print publication:
    August 2019
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  • Effectively Synchronizing 4D-STEM Detectors with Probe Movement

  • Benjamin Bammes, Chenyu Zhang, Robert Bilhorn, Paul M. Voyles
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 68-69
    Print publication:
    August 2019
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  • Applications of High Precision STEM Imaging to Structurally Complex Materials

  • Jie Feng, Chenyu Zhang, Dan Zhou, Zhongnan Xu, Dane Morgan, Paul M. Voyles
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 418-419
    Print publication:
    July 2017
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  • Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3

  • Jie Feng, Alexander V. Kvit, Chenyu Zhang, Dane Morgan, Paul M. Voyles
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 1572-1573
    Print publication:
    July 2017
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  • Three-Dimensional Imaging of Single La Vacancies in LaMnO3

  • Jie Feng, Alexander V. Kvit, Chenyu Zhang, Dane Morgan, Paul M. Voyles
  • Journal:
    / Volume 22 / Issue S3 / July 2016
    Published online by Cambridge University Press:
    25 July 2016, pp. 902-903
    Print publication:
    July 2016
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Page 1 of 2