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52 results

Page 1 of 3

  • Segmentation of “Important” Features in in High Dimensional Nanodiffraction Datasets

  • Carter Francis, Paul Voyles
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 410-412
    Print publication:
    August 2022
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  • An Ultrafast Direct Electron Camera for 4D STEM

  • Debaditya Chatterjee, Jingrui Wei, Alex kvit, Benjamin Bammes, Barnaby Levin, Robert Bilhorn, Paul Voyles
  • Journal:
    / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 1004-1006
    Print publication:
    August 2021
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  • Benchmark tests of atom-locating CNN models with a consistent dataset

  • Jingrui Wei, Ben Blaiszik, Dane Morgan, Paul Voyles
  • Journal:
    / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 2518-2520
    Print publication:
    August 2021
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  • Symmetry Analysis in Metallic Glasses by Electron Nanodiffraction

  • Shuoyuan Huang, Carter Francis, Paul Voyles
  • Journal:
    / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 748-752
    Print publication:
    August 2021
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  • Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series

  • Chenyu Zhang, Jie Feng, Andrew B. Yankovich, Alexander Kvit, Benjamin Berkels, Paul M. Voyles
  • Journal:
    / Volume 27 / Issue 1 / February 2021
    Published online by Cambridge University Press:
    23 November 2020, pp. 90-98
    Print publication:
    February 2021

  • Achieving sub-picometer precision measurements of atomic column positions in high-resolution scanning transmission electron microscope images using nonrigid registration (NRR) and averaging of image series requires careful optimization of experimental conditions and the parameters of the registration algorithm. On experimental data from SrTiO3 [100], sub-pm precision requires alignment of the sample to the zone axis to within 1 mrad tilt and sample drift of less than 1 nm/min. At fixed total electron dose for the series, precision in the fast scan direction improves with shorter pixel dwell time to the limit of our microscope hardware, but the best precision along the slow scan direction occurs at 6 μs/px dwell time. Within the NRR algorithm, the “smoothness factor” that penalizes large estimated shifts is the most important parameter for sub-pm precision, but in general, the precision of NRR images is robust over a wide range of parameters.

  • 4D Scanning Transmission Electron Microscopy of a Twisted WS2 Multilayer Structure

  • Chenyu Zhang, Yuzhou Zhao, Song Jin, Paul Voyles
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 628-630
    Print publication:
    August 2020
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  • Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics

  • Debaditya Chatterjee, Paul Voyles
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 1142-1143
    Print publication:
    August 2020
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  • “Crystallography” of an Amorphous Material Using Electron Nanodiffraction

  • Carter Francis, Debaditya Chatterjee, Sachin Muley, Paul Voyles
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 38-40
    Print publication:
    August 2020
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  • Denoising Atomic Resolution Hyperspectral Data with Tensor Singular Value Decomposition

  • Chenyu Zhang, Rungang Han, Anru Zhang, Paul Voyles
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 1722-1723
    Print publication:
    August 2020
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  • Structural Determination in Metallic Glasses from Correlations in 4D STEM Datasets

  • Carter Francis, Debaditya Chatterjee, Sachin Muley, Paul Voyles
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 940-942
    Print publication:
    August 2020
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  • Electron Correlation Microscopy for Studying Fluctuating Systems In Situ

  • Debaditya Chatterjee, Pei Zhang, Paul M. Voyles
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 1520-1521
    Print publication:
    August 2019
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  • Effectively Synchronizing 4D-STEM Detectors with Probe Movement

  • Benjamin Bammes, Chenyu Zhang, Robert Bilhorn, Paul M. Voyles
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 68-69
    Print publication:
    August 2019
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  • Applications of High Precision STEM Imaging to Structurally Complex Materials

  • Jie Feng, Chenyu Zhang, Dan Zhou, Zhongnan Xu, Dane Morgan, Paul M. Voyles
  • Journal:
    / Volume 23 / Issue S1 / July 2017
    Published online by Cambridge University Press:
    04 August 2017, pp. 418-419
    Print publication:
    July 2017
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Page 1 of 3