19 results
More than a corpus of inscriptions - S. Mitchell, and D. French. 2019. The Greek and Latin Inscriptions of Ankara (Ancyra) 2: Late Roman, Byzantine, and Other Texts. Vestigia 72. Munich: Verlag C. H. Beck. Pp. viii + 347, 6 figs. ISBN 978-3-406-73234-8.
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- Journal of Roman Archaeology / Volume 35 / Issue 2 / December 2022
- Published online by Cambridge University Press:
- 01 December 2022, pp. 1069-1076
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- December 2022
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Mechanisms of Cracking in Pure Magnesium During High Strain Rate Plastic Deformation
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1814-1816
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- August 2022
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Advances in Beam-sensitive Sample Preparation and Observation
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2214-2215
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- August 2022
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Millimeter-scale, Large Uniform Area Semiconductor Device Delayering for Physical Failure Analyses and Quality Control
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3184-3187
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- August 2022
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Metrology of Sample Preparation for Electron Microscopy: Application to Strain Measurements
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
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- 22 July 2022, pp. 768-770
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- August 2022
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Developments in sample preparation of advanced semiconductor devices from the bulk to nanometer-length scales
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1078-1080
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- August 2021
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Advances in EBSD sample preparation by broad ion beam milling
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
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- 30 July 2021, pp. 1836-1839
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- August 2021
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Developments in controlled environmental transfer for Li-based battery materials: From sample preparation to SEM investigation
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1844-1845
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- August 2021
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STEM-in-SEM highly deformed structure investigation with focus on electron-transparent specimen preparation
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1604-1607
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- August 2021
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Strain measurements in industrial applications: A case study of solder bumps in semiconductor devices
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 788-790
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- August 2021
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Alternative Post-FIB Polishing Using Low-Energy Argon Ion Milling to Prevent Grid Redeposition
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 426-429
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- August 2021
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Optimal Specimen Preparation for Correlative Atom Probe Tomography and Electron Microscopy of Environmentally Sensitive Materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2472-2474
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- August 2021
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The rock inscriptions, graffiti and crosses from Quarry GO3C at Göktepe, Muğla district (Turkey)
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- Anatolian Studies / Volume 71 / 2021
- Published online by Cambridge University Press:
- 08 June 2021, pp. 87-128
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- 2021
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Advances in Large-area Sample Preparation Using Broad Argon Ion Beam Milling for Multiphase Materials
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
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- 30 July 2020, pp. 1982-1984
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- August 2020
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Multi-length Scale Cryogenic Sample Preparation to Electron Microscopy of Battery Materials
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 3022-3024
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- August 2020
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Elastic and Plastic Strain Measurement Using Electron Backscatter Diffraction Technique: The Influence of Sample Preparation
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 534-535
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- August 2019
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Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 688-689
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- August 2019
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EBSD and TEM Microstructural Studies of New Fuel Cladding in Generation IV Sodium-cooled Fast Nuclear Reactors
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2224-2225
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- July 2017
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Sample Preparation Using Broad Argon Ion Beam Milling for Electron Backscatter Diffraction (EBSD) Analysis
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 12-13
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- July 2016
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