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  • Fast Ptychographic Reconstruction for Sparse Binary Ptychography Data.

  • Emma Hedley, Björn Eckert, Heike Soltau, Peter D. Nellist
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 438-439
    Print publication:
    August 2022
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  • Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion

  • Colum M. O'Leary, Benedikt Haas, Christoph T. Koch, Peter D. Nellist, Lewys Jones
  • Journal:
    / Volume 28 / Issue 4 / August 2022
    Published online by Cambridge University Press:
    15 September 2021, pp. 1417-1427
    Print publication:
    August 2022
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  • 4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing, and increasingly replacing existing imaging approaches. However, at present the speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance of the recorded 4D data. Here, we present an extension of existing STEM distortion correction techniques for the treatment of 4D data series. Although applicable to 4D data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate an improvement in spatial fidelity, signal-to-noise ratio (SNR), phase precision, and spatial resolution.

  • The Potential for Greater Clarity Cryo-Electron Microscopy via Ptychography

  • Timothy J. Pennycook, Gerardo T. Martinez, Peter D. Nellist, Jannik C. Meyer
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 878-879
    Print publication:
    August 2018
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Page 1 of 2