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27 results

Page 1 of 2

  • Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography

  • David J. Larson, Ty J. Prosa, David Reinhard, Robert M. Ulfig, Michael Holman, Dan Lenz
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 718-720
    Print publication:
    August 2022
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  • Yield Assessment of Protective Coatings for Atom Probe Analysis

  • Yimeng Chen, Katherine P. Rice, Robert M. Ulfig
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 72-73
    Print publication:
    August 2022
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  • The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes

  • Jonathan Op de Beeck, Jeroen E. Scheerder, Brian P. Geiser, Joseph H. Bunton, Robert M. Ulfig, David J. Larson, Paul van der Heide, Wilfried Vandervorst, Claudia Fleischmann
  • Journal:
    / Volume 28 / Issue 4 / August 2022
    Published online by Cambridge University Press:
    05 November 2021, pp. 1141-1149
    Print publication:
    August 2022

  • Reliable spatially resolved compositional analysis through atom probe tomography requires an accurate placement of the detected ions within the three-dimensional reconstruction. Unfortunately, for heterogeneous systems, traditional reconstruction protocols are prone to position some ions incorrectly. This stems from the use of simplified projection laws which treat the emitter apex as a spherical cap, although the actual shape may be far more complex. For instance, sampled materials with compositional heterogeneities are known to develop local variations in curvature across the emitter due to their material phase specific evaporation fields. This work provides three pivotal precursors to improve the spatial accuracy of the reconstructed volume in such cases. First, we show scanning probe microscopy enables the determination of the local curvature of heterogeneous emitters, thus providing the essential information for a more advanced reconstruction considering the actual shape. Second, we demonstrate the cyclability between scanning probe characterization and atom probe analysis. This is a key ingredient of more advanced reconstruction protocols whereby the characterization of the emitter topography is executed at multiple stages of the atom probe analysis. Third, we show advances in the development of an electrostatically driven reconstruction protocol which are expected to enable reconstruction based on experimental tip shapes.

  • Electrostatic Reconstruction Technology in Atom Probe Tomography

  • Brian Geiser, Isabelle Martin, David Reinhard, Dan Lenz, Ty Prosa, Robert Ulfig, David Larson
  • Journal:
    / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 2482-2483
    Print publication:
    August 2021
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  • Directions in Atom Probe Tomography

  • David Larson, Dan Lenz, Isabelle Martin, Ty Prosa, David Reinhard, Peter Clifton, Brian Geiser, Robert Ulfig, Joe Bunton
  • Journal:
    / Volume 27 / Issue S1 / August 2021
    Published online by Cambridge University Press:
    30 July 2021, pp. 2464-2466
    Print publication:
    August 2021
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  • Fixturing Options for Atom Probe Tomography

  • Katherine Rice, Yimeng Chen, Robert Ulfig, Tsuyoshi Onishi
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, pp. 2710-2711
    Print publication:
    August 2020
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  • Study of Correlative Evaporation and Ion Dissociation in Atom Probe Data

  • Yimeng Chen, Brian Geiser, Ed Oltman, Katherine Rice, Robert Ulfig, Ty Prosa
  • Journal:
    / Volume 26 / Issue S2 / August 2020
    Published online by Cambridge University Press:
    30 July 2020, p. 2882
    Print publication:
    August 2020
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  • The ultimate microscopy—enabling nanotechnology

  • Robert Ulfig
  • Journal:
    MRS Bulletin / Volume 45 / Issue 4 / April 2020
    Published online by Cambridge University Press:
    09 April 2020, p. 261
    Print publication:
    April 2020
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  • Grain Boundary Analysis of Inconel 718 Using a Novel Atom Probe Design

  • Katherine P. Rice, Robert M. Ulfig, Yimeng Chen, Ty J. Prosa, David J. Larson
  • Journal:
    / Volume 24 / Issue S1 / August 2018
    Published online by Cambridge University Press:
    01 August 2018, pp. 2212-2213
    Print publication:
    August 2018
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Page 1 of 2