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EDX Analysis of Low Concentration Dopant using HD-2700 Aberration Corrected STEM Equipped with Dual SDD
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2013-2014
- Print publication:
- August 2015
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Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs
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- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 604-605
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- August 2014
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A FIB Micro-Sampling Technique for Three-Dimensional Characterization of a Site-Specific Defect
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- Journal:
- / Volume 12 / Issue 6 / November 2004
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
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- November 2004
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Direct 3D (S)TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique
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- Journal:
- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1164-1165
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- August 2004
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3D Elemental Mapping Using a Dedicated FIB/STEM System
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- Journal:
- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1030-1031
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- August 2004
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A FIB Micro-Sampling Technique and a Site-Specific TEM Specimen Preparation Method for Precision Materials Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 636 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D9.35.1
- Print publication:
- 2000
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