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Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1599-1600
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- August 2015
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Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope
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- Journal:
- / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1861-1862
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- August 2015
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Monochromator for Aberration-Corrected STEM
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- Journal:
- / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 606-607
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- August 2014
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Performance of Mirai-21 Analytical Electron Microscope
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- Journal:
- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 858-859
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- August 2004
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Cs Corrector for Imaging
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- Journal:
- / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 976-977
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- August 2004
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