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95 results

Page 1 of 5

  • Multi-Signal Characterization of Biological Structures at Low-Voltage Using STEM-in-SEM

  • Kelly Parker, Abhalaxmi Singh, Vinayak P. Dravid
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 1108-1110
    Print publication:
    August 2022
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  • Dose-Efficient Defect Contrast with 4D-STEM

  • Stephanie M. Ribet, Colin Ophus, Roberto dos Reis, Vinayak P. Dravid
  • Journal:
    / Volume 28 / Issue S1 / August 2022
    Published online by Cambridge University Press:
    22 July 2022, pp. 346-348
    Print publication:
    August 2022
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  • Revealing the Complex Structural Intergrowth Within Ternary W-Nb-O Oxide

  • Xiaobing Hu, Qian Rong, Roberto dos Reis, Vinayak P. Dravid
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 2172-2173
    Print publication:
    August 2019
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  • “Hybrid” Microscopy: Multimodal, Correlative and Dynamic Characterization of Soft and Hybrid Structures

  • Vinayak P Dravid
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 1744-1745
    Print publication:
    August 2019
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  • Metal Thio/Selenophosphates: A Novel Two-Dimensional Materials System

  • Matthew Cheng, Roberto do Reis, Daniel Chica, Mercouri Kanatzidis, Vinayak P. Dravid
  • Journal:
    / Volume 25 / Issue S2 / August 2019
    Published online by Cambridge University Press:
    05 August 2019, pp. 978-979
    Print publication:
    August 2019
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  • Ion Beam Induced Artifacts in Lead-Based Chalcogenides

  • Xiaomi Zhang, Shiqiang Hao, Gangjian Tan, Xiaobing Hu, Eric W. Roth, Mercouri G. Kanatzidis, Chris Wolverton, Vinayak P. Dravid
  • Journal:
    / Volume 25 / Issue 4 / August 2019
    Published online by Cambridge University Press:
    14 May 2019, pp. 831-839
    Print publication:
    August 2019

  • Metal chalcogenides have attracted great attention because of their broad applications. It has been well acknowledged that microstructure can alter the intrinsic properties and performance of metal chalcogenides. The structure–property–performance relationships can be investigated at atomic scale with scanning transmission and transmission electron microscopy (STEM and TEM). Nevertheless, careful specimen preparation is paramount for accurate analyses and interpretations. In this work, we compare the effects of a variety of well-established TEM specimen preparation methods on the observed microstructure of an ingot stoichiometric lead telluride (PbTe). Most importantly, from aberration corrected STEM and first principles calculations, we discovered that argon (Ar) ion milling can lead to surface irradiation damage in the form of Pb vacancy clusters and self-interstitial atom (SIA) clusters. The SIA clusters appear as orthogonal nanoscale features when characterized along the <001> crystal orientation of the rock salt structured PbTe. This obfuscates the interpretation of the intrinsic microstructure of metal chalcogenides, especially lead chalcogenides. We demonstrate that with sufficiently low energy (300 eV) Ar ion cleaning or appropriate high-temperature annealing, the surface damage layer can be properly cleaned and the orthogonal nanoscale features are significantly reduced. This reveals the materials’ intrinsic structure and can be used as the standard protocol for future TEM specimen preparation of lead-based chalcogenide materials.

Page 1 of 5