5 results
Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1232 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1232-OO07-01
- Print publication:
- 2009
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Lateral uniformity of the transport properties of graphene/4H-SiC (0001) interface by nanoscale current measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1205 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1205-L03-02
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- 2009
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Nanoscale Modification of Graphene Transport Properties by Ion Irradiation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1203 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1203-J09-02
- Print publication:
- 2009
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Strengths and Limitations of the Vacancy Engineering Approach for the Control of Dopant Diffusion and Activation in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1070 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1070-E01-02
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- 2008
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Properties of Pr-based high k dielectric films obtained by Metal-Organic Chemical Vapor Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 811 / 2004
- Published online by Cambridge University Press:
- 28 July 2011, D9.10
- Print publication:
- 2004
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