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X-ray diffraction study of a Si Σ13 symmetric tilt grain boundary
Published online by Cambridge University Press: 01 November 2010
Abstract
We present an X-ray diffraction study of a semiconductor symmetric tilt grain boundary. The theory of crystal truncation rod scattering is extended to bicrystal interfaces and compared with experimental data measured at the Diamond Light Source.
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- Copyright © Diamond Light Source Ltd 2010
References
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