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Artificial intelligence/machine learning in manufacturing and inspection: A GE perspective

Published online by Cambridge University Press:  12 July 2019

Kareem S. Aggour
Affiliation:
GE Research, USA, aggour@ge.com
Vipul K. Gupta
Affiliation:
GE Research, USA, vipul.k.gupta@ge.com
Daniel Ruscitto
Affiliation:
GE Research, USA, ruscitto@ge.com
Leonardo Ajdelsztajn
Affiliation:
GE Research, USA, ajdelsztajn@ge.com
Xiao Bian
Affiliation:
GE Research, USA, xiao.bian@ge.com
Kristen H. Brosnan
Affiliation:
GE Research, USA, brosnan@ge.com
Natarajan Chennimalai Kumar
Affiliation:
GE Research, USA, kumarn@ge.com
Voramon Dheeradhada
Affiliation:
GE Research, USA, dheeradh@research.ge.com
Timothy Hanlon
Affiliation:
GE Research, USA, hanlon@research.ge.com
Naresh Iyer
Affiliation:
GE Research, USA, iyerna@ge.com
Jaydeep Karandikar
Affiliation:
GE Research, USA, jaydeep.karandikar@ge.com
Peng Li
Affiliation:
GE Research, USA, peng.lee@ge.com
Abha Moitra
Affiliation:
GE Research, USA, moitraa@ge.com
Johan Reimann
Affiliation:
GE Research, USA, reimann@ge.com
Dean M. Robinson
Affiliation:
GE Research, USA, robinsondm@ge.com
Alberto Santamaria-Pang
Affiliation:
GE Research, USA, santamar@ge.com
Chen Shen
Affiliation:
GE Research, USA, chens@ge.com
Monica A. Soare
Affiliation:
GE Research, USA, soare@ge.com
Changjie Sun
Affiliation:
GE Research, USA, sunc@ge.com
Akane Suzuki
Affiliation:
GE Research, USA, suzukia@ge.com
Raju Venkataramana
Affiliation:
GE Research, USA, venkataramana@ge.com
Joseph Vinciquerra
Affiliation:
GE Research, USA, joseph.vinciquerra@ge.com
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Abstract

At GE Research, we are combining “physics” with artificial intelligence and machine learning to advance manufacturing design, processing, and inspection, turning innovative technologies into real products and solutions across our industrial portfolio. This article provides a snapshot of how this physical plus digital transformation is evolving at GE.

Type
The Machine Learning Revolution in Materials Research
Copyright
Copyright © Materials Research Society 2019 

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