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Photoelectrochemical properties and crystalline structure change of Sb-doped TiO2 thin films prepared by the sol-gel method

Published online by Cambridge University Press:  01 November 2004

Zongmin Bei ,
Dasen Ren ,
Xiaoli Cui ,
Jie Shen ,
Xiliang Yang  and
Zhuangjian Zhang
Zongmin Bei
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
Dasen Ren*
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
Xiaoli Cui
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
Jie Shen
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
Xiliang Yang
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
Zhuangjian Zhang
Affiliation:
Department of Materials Science, Fudan University, Shanghai 200433, People’s Republic of China
*
a)Address all correspondence to this author. e-mail: senrd@vip.sina.com
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Abstract

Ti1−XSbXO2 samples were obtained from dip-coating sol-gel method and a subsequent anneal at 450 °C. They had an average crystallite size of 13.3–20 nm. Cyclic voltammograms taken under ultraviolet (UV) and Xe lamp illumination in a 0.5 M Na2SO4 electrolyte showed that the Sb-doped samples had greater photocurrent densities than pure titania electrode, with an optimal Sb concentration of 0.2%. Oxidative peaks were observed in the cyclic voltammograms obtained in the dark after certain exposure duration to UV light. X-ray diffraction patterns and Raman spectra show a phase transformation from brookite to anatase in the samples with Sb concentration up to 0.2%. Ti4+ ions were substituted by Sb to form the anatase structure of Sb–O–Ti, improving the crystallization efficiency. The Sb–Sb bonds were formed due to the introduction of excessive Sb atoms.

Keywords

Thin filmSol-gelX-ray diffraction (XRD)
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 11 , November 2004 , pp. 3189 - 3195
Copyright
Copyright © Materials Research Society 2004

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