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Adaptive Scanning in Ptychography through Deep Reinforcement Learning

Published online by Cambridge University Press:  30 July 2021

Marcel Schloz ,
Johannes Müller ,
Thomas Pekin ,
Wouter Van den Broek  and
Christoph Koch
Marcel Schloz
Affiliation:
Humboldt Universität zu Berlin, United States
Johannes Müller
Affiliation:
Humboldt Universität zu Berlin, United States
Thomas Pekin
Affiliation:
Humboldt Universität zu Berlin, United States
Wouter Van den Broek
Affiliation:
Humboldt Universität zu Berlin, Berlin, Berlin, United States
Christoph Koch
Affiliation:
Department of Physics, Humboldt University of Berlin, Berlin, Germany, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 818 - 821
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Schloz, Marcel, et al. "Overcoming information reduced data and experimentally uncertain parameters in ptychography with regularized optimization." Optics Express 28.19 (2020): 28306-28323.CrossRefGoogle ScholarPubMed