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An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)

Published online by Cambridge University Press:  01 August 2018

Hamed Safaie ,
Ria L. Mitchell ,
Richard Johnston ,
James Russell  and
Cameron Pleydell-Pearce
Hamed Safaie
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
Ria L. Mitchell
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
Richard Johnston
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
James Russell
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.
Cameron Pleydell-Pearce
Affiliation:
Advanced Imaging of Materials (AIM) Facility, College of Engineering, Swansea University, Swansea, UK.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 400 - 401
Copyright
© Microscopy Society of America 2018 

References

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[4] Massoumian, F, et al, Journal of Microscopy 209(Pt.1 2003) p. 13.Google Scholar