Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-05-29T10:54:18.540Z Has data issue: false hasContentIssue false
  • English
  • Français

Applications of Low Dose Electron Ptychography.

Published online by Cambridge University Press:  22 July 2022

AI Kirkland ,
J. S. Kim ,
C. S. Allen ,
C. Huang ,
E Liberti ,
CM O'Leary ,
P. D. Nellist  and
P. Wang
AI Kirkland*
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, UK
J. S. Kim
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
C. S. Allen
Affiliation:
Department of Materials, University of Oxford, Oxford, UK Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, UK
C. Huang
Affiliation:
Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
E Liberti
Affiliation:
Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK
CM O'Leary
Affiliation:
Department of Physics, University of California, Loss Angeles, Los Angeles, CA, United States
P. D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK
P. Wang
Affiliation:
Department of Physics, University of Warwick, Coventry CV4 7AL, UK
*
*Corresponding author: angus.kirkland@materials.ox.ac.uk

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 352 - 354
Check for updates
Copyright
Copyright © Microscopy Society of America 2022

References

Tate, M W et al. , Microsc Microanal. 22 (1), 237 (2016).10.1017/S1431927615015664CrossRefGoogle Scholar
Mir, J.A. et al. , Ultramicroscopy, 182, 44 (2017).10.1016/j.ultramic.2017.06.010CrossRefGoogle Scholar
Rodenburg, J. M. and Bates, R. H. T., Phil. Trans. Roy. Soc., 339, 521 (1992).Google Scholar
Faulkner, H. M. L. and Rodenberg, J. M., Phys. Rev. Lett. 93, 023903–1 (2004).10.1103/PhysRevLett.93.023903CrossRefGoogle Scholar
O'Leary, C. M. et al. , Appl. Phys. Letts, 116, 124101 (2020).10.1063/1.5143213CrossRefGoogle Scholar
Zhou, L. et al. , Nature Comm., 11, 2733 (2020).Google Scholar