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Assessing the Phase Accuracy of ePIE Reconstructions of Crystalline Materials
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Phase Retrieval Microscopy
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[7]The collaboration with Hitachi High Technologies Canada in developing the software and incorporating the hardware on the HF3300V TEM used here is acknowledged with sincere thanks.Google Scholar
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