Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-10-31T23:15:22.287Z Has data issue: false hasContentIssue false

Automatic Calibrations of Sample Misalignment for Nanotomography at SSRF

Published online by Cambridge University Press:  10 August 2018

Limei Ma
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Zhi Guo
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Xiangzhi Zhang*
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Zijian Xu
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Haigang Liu
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Lijuan Zhang
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Yong Wang
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
Renzhong Tai
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, No. 239 Zhangheng Road Pudong New District ShanghaiChina
*
* Xiangzhi Zhang, zhangxiangzhi@sinap.ac.cn

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Xue, C, etal, Review of Scientific Instruments 81.10 2010 103502.Google Scholar
[2] Schmid, Gregor, etal, Microscopy and Microanalysis 20.2 2014 531536.Google Scholar
[3] Hitchcock, A P, et al, Applied Physics A 92.3 2008 447452.Google Scholar
[4] Johansson, , et al, Journal of Synchrotron Radiation 14.5 2007 395402.Google Scholar