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The Case for Lower Voltage TEMs: A 100 keV FEG for High Resolution Microscopy

Published online by Cambridge University Press:  22 July 2022

Mohamed M. El-Gomati ,
Torquil Wells ,
Xiaoping Zha ,
Richard Sykes ,
Christopher J. Russo ,
Richard Henderson  and
Greg McMullan
Mohamed M. El-Gomati*
Affiliation:
York Probe Sources Ltd, York, UK Department of Electronics Engineering, University of York, Heslington, York, UK
Torquil Wells
Affiliation:
York Probe Sources Ltd, York, UK
Xiaoping Zha
Affiliation:
York Probe Sources Ltd, York, UK
Richard Sykes
Affiliation:
York Probe Sources Ltd, York, UK
Christopher J. Russo
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, UK
Richard Henderson
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, UK
Greg McMullan
Affiliation:
MRC Laboratory of Molecular Biology, Cambridge, UK
*
*mohamed.elgomati@yps-ltd.com

Abstract

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Type
Technical Advances in Cryo-EM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1168 - 1169
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Copyright
Copyright © Microscopy Society of America 2022

References

Peet, MJ, Henderson, R and Russo, CJ, Ultramicroscopy 203 (2019), p. 125.CrossRefGoogle Scholar
Egerton, RF, Ultramicroscopy 145 (2014), p. 85.CrossRefGoogle Scholar
Zhang, H et al. , Nature Nanotechnology 17 (2022), p. 21.CrossRefGoogle Scholar
Duncan, CJR, Muller, DA and Maxson, JM, Phys. Rev. Applied 14 (2022), p. 014060.CrossRefGoogle Scholar
El-Gomati, M. et al. , J. Vac. Sci. Technol. B 39(6) (2021), p. 062804-1. doi: 10.1116/6.0001275.CrossRefGoogle Scholar
The work presented here has been partly funded by generous grants from: Innovate UK grant no. 103806, the Medical Research Council grants; MC_U105184322, MC_UP_120117, the Welcome Trust Fund Nos. 22056/B/20/Z and EPSRC R122522.Google Scholar