Hostname: page-component-848d4c4894-wzw2p Total loading time: 0 Render date: 2024-06-02T04:51:49.642Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Published online by Cambridge University Press:  27 August 2014

Jesús Cantú-Valle ,
Francisco Ruiz-Zepeda ,
Ulises Santiago ,
Fernando Mendoza-Santoyo ,
Miguel Jose-Yacaman  and
Arturo Ponce
Jesús Cantú-Valle
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States
Francisco Ruiz-Zepeda
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States
Ulises Santiago
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States
Fernando Mendoza-Santoyo
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States
Miguel Jose-Yacaman
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States
Arturo Ponce
Affiliation:
Department of Physics and Astronomy, University of Texas at San Antonio, One UTSA Circle, San Antonio, Texas 78249, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 290 - 291
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Elechiguerra, J.L, et al., J. Mater. Chem. 16 (2006) 3906-3919.Google Scholar
[2] Tonomura, A. Rev. Mod. Phys. 59-3 (1987).Google Scholar
[3] Wang, Y.Y, et al., Ultramicroscopy 101 (2004). 63-72.Google Scholar
[4] The authors acknowledge the NSF PREM # DMR 0934218. Also, would like to acknowledge grants from CONACYT- I²T² # 311149.Google Scholar