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Characterizing Dzyaloshinskii Domain Walls in Asymmetric [Pt/Co/Ni/Ir]N Multi-Layers using Lorentz TEM

Published online by Cambridge University Press:  01 August 2018

Maxwell P. Li ,
Marc De Graef  and
Vincent Sokalski
Maxwell P. Li
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., PittsburghPA15213, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., PittsburghPA15213, USA
Vincent Sokalski
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., PittsburghPA15213, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 948 - 949
Copyright
© Microscopy Society of America 2018 

References

[1] Yu, X. Z., et al., Nature Materials 10 2011) p. 106.Google Scholar
[2] Muhlbauer, S., et al., Science 323 2009) p. 915.Google Scholar
[3] Thiaville, A., et al., EPL (Europhysics Letters) 100 2012) p. 57002.Google Scholar
[4] Vansteenkiste, A., et al., AIP Advances 4 2014) p. 107133.Google Scholar
[5] Authors acknowledge the support by grant MCF-677785, Materials Characterization Facility at Carnegie Mellon University.Google Scholar