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Deep Learning for Sparse Scanning Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Patrick Trampert ,
Sabine Schlabach ,
Tim Dahmen  and
Philipp Slusallek
Patrick Trampert*
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrücken, Germany. Saarland University, 66123 Saarbrücken, Germany.
Sabine Schlabach
Affiliation:
Karlsruhe Institute of Technology, 76131 Karlsruhe, Germany.
Tim Dahmen
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrücken, Germany.
Philipp Slusallek
Affiliation:
German Research Center for Artificial Intelligence GmbH (DFKI), Saarbrücken, Germany. Saarland University, 66123 Saarbrücken, Germany.
*
*Corresponding author: patrick.trampert@dfki.de

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 158 - 159
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bourghorbel, F et al. , Microscopy and Microanalysis (23) (S1) (2017), p. 150.Google Scholar
[2]Trampert, P et al. , Ultramicroscopy 191 (2018) p. 11.Google Scholar
[3]Trampert, P et al. , Microscopy and Microanalysis 24 (S1) (2018) p.700.Google Scholar
[4]Ulyanov, D et al. , IEEE CVPR (2017).Google Scholar
[5]Research has been supported by Thermo Fisher Scientific. We thank the Repos project (BMBF) for provided images and U. Tallarek and his team at Uni Marburg for the samples. The authors thank the DFKI GmbH for additional funding and for providing the necessary infrastructure.Google Scholar