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Detecting Localized Variation of Chemistry via Atomic-Resolution Secondary Electron Imaging

Published online by Cambridge University Press:  23 September 2015

Jane Howe ,
Yoichiro Hashimoto ,
Xue Wang ,
Madeline Vara ,
David Hoyle ,
Tom Schamp ,
Younan Xia  and
David Joy
Jane Howe
Affiliation:
Hitachi High-Technologies Canada Inc, Toronto, Canada
Yoichiro Hashimoto
Affiliation:
Science System Design Division, Hitachi High-Technologies Co., Hitachinaka, Ibaraki, Japan
Xue Wang
Affiliation:
The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA
Madeline Vara
Affiliation:
The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA
David Hoyle
Affiliation:
Hitachi High-Technologies Canada Inc, Toronto, Canada
Tom Schamp
Affiliation:
Hitachi High-Technologies America Inc, Gaithersburg, USA
Younan Xia
Affiliation:
The School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, USA
David Joy
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1265 - 1266
Copyright
Copyright © Microscopy Society of America 2015 

References

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