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Diffraction Mapping with a Pixelated Detector to Quantify Crystal Orientation in 3D Structures Made from 2D Materials

Published online by Cambridge University Press:  05 August 2019

Michael C. Cao ,
Joonki Suh ,
Zhen Chen ,
Elliot Padgett ,
Chibeom Park ,
Jiwoong Park  and
David A. Muller
Michael C. Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Joonki Suh
Affiliation:
Department of Chemistry, University of Chicago, Chicago, IL, USA School of Materials Science and Engineering, Ulsan National Institute of Science and Technology, Ulsan, Republic of Korea
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Chibeom Park
Affiliation:
James Franck Institute, University of Chicago, Chicago, IL, USA
Jiwoong Park
Affiliation:
Department of Chemistry, University of Chicago, Chicago, IL, USA James Franck Institute, University of Chicago, Chicago, IL, USA Institute for Molecular Engineering, University of Chicago, Chicago, IL, USA
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY, USA
*
*Corresponding author: david.a.muller@cornell.edu

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1956 - 1957
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Huang, P.Y. et al. , Nature 469 (2011) p. 389-392Google Scholar
[2]Tate, M. W. et al. , Microscopy and Microanalysis 22 (2016), p. 237-249.Google Scholar
[3]Srolovitz, D.J. et al. , Physical Review Letters 74 (1995), p. 1779Google Scholar
[4]Funding from the DOD/AFOSR 2D MURI project (FA9550-16-1-0031) and facilities support from the Cornell Center for Materials Research, an NSF MRSEC (DMR-1719875).Google Scholar