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Efficient Sampling and Reconstruction Strategies for in-situ SEM/STEM

Published online by Cambridge University Press:  22 July 2022

N. D. Browning ,
M. Bahri ,
J. Castagna ,
K. Chen ,
B. L. Mehdi ,
D. Nicholls ,
W. Pearson ,
A. W. Robinson ,
J. Taylor  and
J. Wells
...Show all authors
N. D. Browning
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, UK Physical & Computational Science, Pacific Northwest National Lab, Richland, WA 99352, USA Sivananthan Laboratories, 590 Territorial Drive, Bolingbrook, IL 60440, USA
M. Bahri
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, UK
J. Castagna
Affiliation:
UKRI-STFC Hartree Centre, Daresbury Laboratory, Warrington, WA4 4AD, UK
K. Chen
Affiliation:
Department of Mathematical Sciences, University of Liverpool, Liverpool, L79 7ZL, UK
B. L. Mehdi
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, UK
D. Nicholls
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, UK
W. Pearson
Affiliation:
Distributed Algorithms CDT, University of Liverpool, Liverpool, L69 3GH, UK
A. W. Robinson
Affiliation:
Mechanical, Materials, & Aerospace Engineering, University of Liverpool, Liverpool, L69 3GH, UK
J. Taylor
Affiliation:
Distributed Algorithms CDT, University of Liverpool, Liverpool, L69 3GH, UK
J. Wells
Affiliation:
Distributed Algorithms CDT, University of Liverpool, Liverpool, L69 3GH, UK
Y. Zheng
Affiliation:
Department of Eye and Vision Science, University of Liverpool, Liverpool. L7 8TX, UK

Abstract

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Type
In Situ TEM Characterization of Dynamic Processes During Materials Synthesis and Processing
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 1878 - 1879
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Copyright
Copyright © Microscopy Society of America 2022

References

Nicholls et, D.. al, Nanoscale 12 (41), (2020).CrossRefGoogle Scholar
Nicholls, D. et al. , Ultramicroscopy, 233, (2022).CrossRefGoogle Scholar
Zhou, M. et al. , IEEE Transactions on Image Processing 21, 130-144 (2012)CrossRefGoogle Scholar