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Examination of a 19th Century Daguerreotype Photograph using High Resolution Scanning Transmission Electron Microscopy for 2D and 3D Nanoscale Imaging and Analysis

Published online by Cambridge University Press:  27 August 2014

Edward P. Vicenzi ,
Trevan Landin  and
Andrew A. Herzing
Edward P. Vicenzi
Affiliation:
Smithsonian Institution, Museum Conservation Institute, Suitland, MD 20746, USA National Institute of Standards and Technology, Materials Measurement Science Division, Gaithersburg, MD 20899, USA
Trevan Landin
Affiliation:
FEI Company, Hillsboro, OR 97124, USA
Andrew A. Herzing
Affiliation:
National Institute of Standards and Technology, Materials Measurement Science Division, Gaithersburg, MD 20899, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2000 - 2001
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Barger, MS, White, WB “The daguerreotype: nineteenth-century technology and modern science” The Johns Hopkins University Press (2000), 280 pgs.Google Scholar
[2] Swan, A, Fiori, CE, and Heinrich, KFJ Scanning electron microscopy 1 (1979), 411-423.Google Scholar
[3] Keenan, MR Surface and Interface Analysis. 41(2 (2009) 79-87.Google Scholar
[4] Kotula, P. G., Keenan, M. R., and Michael, J. R. Microscopy and Microanalysis, 9 (2003) 1.Google Scholar