Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-06-03T00:27:43.023Z Has data issue: false hasContentIssue false
  • English
  • Français

Examination of Heritage and Geological Materials Using Correlated Electron- and X-ray-Beam Microanalysis in the SEM

Published online by Cambridge University Press:  05 August 2019

Edward P. Vicenzi  and
Thomas Lam
Edward P. Vicenzi*
Affiliation:
Smithsonian Institution, Museum Conservation Institute, Suitland, MD., USA.
Thomas Lam
Affiliation:
Smithsonian Institution, Museum Conservation Institute, Suitland, MD., USA.
*
*Corresponding author: vicenzie@si.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Characterization of Geological and Extraterrestrial Samples
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2482 - 2483
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jenner, FE & Arevalo, RD, Elements 12 (2016), p. 311-316.Google Scholar
[2]Haschke, M, “Laboratory Micro-X-Ray Fluorescence Spectroscopy” Springer (2014), 356 p.Google Scholar
[3]Haschke, M & Boehm, S, in “Advances in Imaging and Electron Physics” ed. Hawkes, (2017) p.1-60.Google Scholar
[4]Buchwald, VF & Clarke, RS Jr, American Mineralogist 74 (1989), p. 656-467.Google Scholar
[5]The authors gratefully acknowledge materials received from the reference collection of the National Museum of the American Indian, Smithsonian Institution.Google Scholar