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Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM

Published online by Cambridge University Press:  22 July 2022

Ryusuke Sagawa ,
Akira Yasuhara ,
Hiroki Hashiguchi ,
Tomoyuki Naganuma ,
Shinichi Tanba ,
Takaki Ishikawa ,
Thomas Riedel ,
Peter Hartel ,
Martin Linck  and
Stephan Uhlemann
...Show all authors
Ryusuke Sagawa*
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Akira Yasuhara
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Hiroki Hashiguchi
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Tomoyuki Naganuma
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Shinichi Tanba
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Takaki Ishikawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan
Thomas Riedel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, Heidelberg, Germany
Peter Hartel
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, Heidelberg, Germany
Martin Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, Heidelberg, Germany
Stephan Uhlemann
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, Heidelberg, Germany
Heiko Müller
Affiliation:
Corrected Electron Optical Systems GmbH, Englerstr. 28, Heidelberg, Germany
Hidetaka Sawada
Affiliation:
JEOL USA, Inc., 11 Dearborn Road Peabody, MA, USA
*
*Corresponding author: rsagawa@jeol.co.jp

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2634 - 2635
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Copyright
Copyright © Microscopy Society of America 2022

References

Haider, M et al. , Ultramicroscopy, 81 (2000) p. 163.CrossRefGoogle Scholar
Müller, H et al. , Microscopy and Microanalysis, 12 (6) (2008) p. 442.Google Scholar
Sagawa, R et al. , Ultramicroscopy, 233 (2022) p. 113440.CrossRefGoogle Scholar
Morishita, S et al. , Physical Review Letters, 117 (15) (2016) p. 153004.CrossRefGoogle Scholar
Hartel, P et al. , Ultramicroscopy, 206 (2019) p. 112821.CrossRefGoogle Scholar