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Fast and Low-dose Electron Ptychography

Published online by Cambridge University Press:  01 August 2018

Jiamei Song ,
Biying Song ,
Liqi Zou ,
Christopher Allen ,
Hidetaka Sawada ,
Fucai Zhang ,
Xiaoqing Pan ,
Angus. I. Kirkland  and
Peng Wang
Jiamei Song
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Biying Song
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Liqi Zou
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Christopher Allen
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, U.K.
Hidetaka Sawada
Affiliation:
JEOL Ltd, Akishima, Tokyo, Japan.
Fucai Zhang
Affiliation:
Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China.
Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA.
Angus. I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, U.K.
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 224 - 225
Copyright
© Microscopy Society of America 2018 

References

[1] Sawada, H, et al, J Electron Microsc (Tokyo) 58 2009) p. 357.Google Scholar
[2] Maiden, AM Rodenburg, JM Ultramicroscopy 109 2009) p. 1256.Google Scholar
[3] Nellist, PD, McCallum, BC Rodenburg, JM Nature 374 1995) p. 630.Google Scholar
[4] Wang, P, et al., Scientific Reports 7 2017) p. 2857.Google Scholar
[5] Yang, H, et al, Nat. Comm 7 2016) p. 12532.Google Scholar
[6] D'Alfonso, AJ, et al., Journal of Applied Physics 119 2016) p. 054302.Google Scholar
[7] Gao, S, et al, Nature Communications 8 2017) p. 163.Google Scholar
[8] Mir, JA, et al, Ultramicroscopy 182 2017) p. 44.Google Scholar
[9] Tate, MW, et al, Microsc. Microanal. 22 2016) p. 237.Google Scholar
[10] The authors acknowledge funding from the National Natural Science Foundation of China (11474147), and the National Basic Research Program of China, (Grant No. 2015CB654901).Google Scholar