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HAADF-STEM Investigation of III-V Semiconductors Grown on Nanopatterned Si(001) Substrates

Published online by Cambridge University Press:  01 August 2018

Roksolana Kozak
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland
Ivan Prieto
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland Laboratory for Solid State Physics, ETH Zürich, Zürich, Switzerland
Yadira Arroyo Rojas Dasilva
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland
Rolf Erni
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland
Hans von Känel
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland Laboratory for Solid State Physics, ETH Zürich, Zürich, Switzerland
Gian-Luca Bona
Affiliation:
Empa - Swiss Federal Laboratories for Materials Science & Technology, Dubendorf, Switzerland
Marta D. Rossell
Affiliation:
Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

[1] del Alamo, J. A. Nature 479 2011) p 317.Google Scholar
[2] Skibitzki, O., et al, Nanotechnology 28 2017) p 135301.Google Scholar
[3] Prieto, I., et al, Nanotechnology 28 2017) p 135701.Google Scholar
[4] Kozak, R., et al, Philos. Mag 97 2017) p 2845.Google Scholar
[5] The authors acknowledge funding from the SNSF, Grant Number DACH-200021L-153558 and DFG, Grant Number DACH-SCHR 1123/10-1. Prof. Thomas Schroeder and Dr. Oliver Skibitzki from IHP are thanked for providing nanopatterned Si substrates.Google Scholar