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High-Resolution Electron Diffraction of Protein Crystals in Their Liquid Environment at Room Temperature Using a Direct Electron Detection Camera

Published online by Cambridge University Press:  22 July 2022

Sergi Plana-Ruiz ,
Wai Li Ling ,
Dominique Housset ,
César Santiago ,
Diana Peckys ,
Jaime Martín-Benito ,
Alejandro Gómez-Pérez ,
Partha Pratim Das  and
Stavros Nicolopoulos
Sergi Plana-Ruiz*
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium Servei de Recursos Científics i Tècnics, Universitat Rovira i Virgili, Tarragona 43007, Spain
Wai Li Ling
Affiliation:
Université Grenoble Alpes, CEA, CNRS, IBS, Grenoble 38000, France
Dominique Housset
Affiliation:
Université Grenoble Alpes, CEA, CNRS, IBS, Grenoble 38000, France
César Santiago
Affiliation:
Centro Nacional de Biotecnología, Madrid 28049, Spain
Diana Peckys
Affiliation:
Clinic of Operative Dentistry, Periodontology and Preventive Dentistry, University Hospital, Saarland University, Homburg/Saar 66421, Germany
Jaime Martín-Benito
Affiliation:
Centro Nacional de Biotecnología, Madrid 28049, Spain
Alejandro Gómez-Pérez
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
Partha Pratim Das
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
Stavros Nicolopoulos*
Affiliation:
NanoMegas SRPL, Rue Emile Claus 49, Brussels 1050, Belgium
*
*Corresponding author: sergi.plana@urv.cat; info@nanomegas.com
*Corresponding author: sergi.plana@urv.cat; info@nanomegas.com

Abstract

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Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2246 - 2249
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Copyright
Copyright © Microscopy Society of America 2022

References

Henderson, R. and Unwin, P.N.T., Nature 257 (1975), p. 28-32. doi:10.1038/257028a0Google Scholar
Frank, J., Ultramicroscopy 1 (1975), p. 159-162. doi:10.1016/S0304-3991(75)80020-9CrossRefGoogle Scholar
Dubochet, J. and McDowall, A.w., Journal of Microscopy 124 (1981), p. 3-4. doi:10.1111/j.1365-2818.1981.tb02483.xCrossRefGoogle Scholar
Marchello, G. et al. , ArXiv (2019). url: http://arxiv.org/abs/1907.03348Google Scholar
Peckys, D.B., Macías-Sánchez, E. and de Jonge, N., MRS Bulletin 45 (2020), p. 754–760. doi:10.1557/mrs.2020.225.CrossRefGoogle Scholar
Keskin, S. and de Jonge, N., Microscopy and Microanalysis 27 (2021), p. 2902–2903. doi:10.1017/S1431927621010126.CrossRefGoogle Scholar
Bücker, R., Pascal, H.-L. and Dwayne, R.J., Frontiers in Molecular Biosciences 8 (2021), p. 415. doi: 10.3389/fmolb.2021.624264.CrossRefGoogle Scholar
The authors acknowledge the opportunity to use the TEM facilities of Prof. Ute Kolb in the Technische Universität Darmstadt, Germany, and Dr. Edgar Rauch in the CNRS-Grenoble, France, to test some ideas of the presented work. We also acknowledge the IBS/ISBG electron microscopy platform where this work was performed. IBS acknowledges integration into the Interdisciplinary Research Institute of Grenoble (IRIG, CEA).Google Scholar