Hostname: page-component-848d4c4894-mwx4w Total loading time: 0 Render date: 2024-06-14T03:41:19.023Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving Sensitivity and Productivity with High count rate X-ray spectrum images

Published online by Cambridge University Press:  04 August 2017

Simon Burgess ,
Matthew Hiscock  and
Philippe Pinard
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Matthew Hiscock
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 46 - 47
Copyright
© Microscopy Society of America 2017