Hostname: page-component-848d4c4894-2xdlg Total loading time: 0 Render date: 2024-06-14T22:25:02.021Z Has data issue: false hasContentIssue false
  • English
  • Français

Integrated Focused Ion Beam-Ultramicrotomy Method for TEM Specimen Preparation of Porous Fine-Grained Materials

Published online by Cambridge University Press:  05 August 2019

Kenta K. Ohtaki ,
John P. Bradley  and
Hope A. Ishii
Kenta K. Ohtaki
Affiliation:
University of Hawaii HIGP, Honolulu, USA
John P. Bradley
Affiliation:
University of Hawaii HIGP, Honolulu, USA
Hope A. Ishii*
Affiliation:
University of Hawaii HIGP, Honolulu, USA
*
*Corresponding author: ishii3@hawaii.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Focused Ion Beam Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 854 - 855
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]McCaffrey, JP et al. , Ultramicroscopy 87 (2001), p. 97.Google Scholar
[2]Mayer, J et al. , MRS Bulletin 32 (2007), p. 400.Google Scholar
[3]Melo, LG et al. , J Power Sources 312 (2016), p. 23.Google Scholar
[4]Xu, Y et al. , Earth Planets Space 70 (2018), p. 150.Google Scholar