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Lorentz TEM Imaging of Topological Magnetic Features in Asymmetric [Pt/(Co/Ni)M/Ir]N based Multi-Layers

Published online by Cambridge University Press:  05 August 2019

Maxwell Li ,
Derek Lau ,
Marc De Graef  and
Vincent Sokalski
Maxwell Li*
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Derek Lau
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
Vincent Sokalski
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA
*
*Corresponding author: mpli@andrew.cmu.edu

Abstract

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Type
Advances in Phase Retrieval Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 24 - 25
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Dzyaloshinsky, I., J. Phys. Chem. Solids 4, (1958) p. 241.Google Scholar
[2]Moriya, T., Phys. Rev. 120, (1960) p. 91.Google Scholar
[3]Thiaville, A. et al. , EPL (Europhysics Letters) 100, (2012) p. 57002.Google Scholar
[4]Lau, D. et al. , Physical Review B 98, (2018) p. 184410.Google Scholar
[5]Authors acknowledge support by the DARPA program on Topological Excitations in Electronics (TEE) under grant number D18AP00011, the Neil and Jo Bushnell Fellowship at Carnegie Mellon University, and use of the Materials Characterization Facility at Carnegie Mellon University under grant MCF-677785.Google Scholar