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Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI

Published online by Cambridge University Press:  30 July 2021

Joseph Tessmer  and
Marc De Graef
Joseph Tessmer
Affiliation:
Carnegie Mellon University, PITTSBURGH, Pennsylvania, United States
Marc De Graef
Affiliation:
Carnegie Mellon University, Pittsburgh, Pennsylvania, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 998 - 999
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Lenthe, W. C., Singh, S., and De Graef, M.. “A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns.” Ultramicroscopy 207 (2019): 112841.CrossRefGoogle Scholar
Callahan, Patrick G., and De Graef, Marc. “Dynamical electron backscatter diffraction patterns. Part I: Pattern simulations.” Microscopy and Microanalysis 19.5 (2013): 1255.CrossRefGoogle ScholarPubMed
Salvat-Pujol, Francesc, and Werner, Wolfgang SM. “Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm.” Surface and interface analysis 45.5 (2013): 873-894.CrossRefGoogle ScholarPubMed
The authors acknowledge an ONR Vannevar Bush Faculty Fellowship (N00014-16-1-2821), and the computational resources of the Materials Characterization Facility at CMU, grant MCF-677785.Google Scholar