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Multimodal Low-Dimensional Materials Characterization with Correlative Microscopy: Raman-PL-FLIM-AFM-SNOM-SEM

Published online by Cambridge University Press:  25 July 2016

Ute Schmidt
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Wei Liu
Affiliation:
WITec Instruments, Knoxville, TN, USA
David Steinmetz
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Thomas Dieing
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)
Olaf Hollricher
Affiliation:
WITec GmbH, Ulm, Germany (www.witec.de)

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

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