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A New Method for Characterizing 3D Microstructures Using Lab-based Diffraction Contrast Tomography

Published online by Cambridge University Press:  01 August 2018

Hrishikesh Bale ,
Will Harris ,
Steve Kelly ,
Nicolas Gueninchault ,
Jun Sun  and
Erik Lauridsen
Hrishikesh Bale
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Will Harris
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Steve Kelly
Affiliation:
Carl Zeiss X-ray Microscopy, Pleasanton, CA, USA.
Nicolas Gueninchault
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Jun Sun
Affiliation:
Xnovo Technology ApS, K0ge, Denmark
Erik Lauridsen
Affiliation:
Xnovo Technology ApS, K0ge, Denmark

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 988 - 989
Copyright
© Microscopy Society of America 2018 

References

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[2] Juul Jensen, D. Poulsen, H.F. Materials Characterization 72 2012) p. 1.Google Scholar
[3] Keinan, R., et al., Acta Materialia (In Press 2018.Google Scholar
[4] McDonald, S. A., et al., Scientific Reports 7 2017) p. 5251.Google Scholar