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Opportunities for Electron Backscattered Diffraction Enabled by Direct Electron Detection

Published online by Cambridge University Press:  30 July 2020

Fulin Wang ,
McLean Echlin ,
Jungho Shin ,
Benjamin Bammes ,
Marc De Graef ,
Tresa Pollock  and
Daniel Gianola
Fulin Wang
Affiliation:
University of California-Santa Barbara, Santa Barbara, California, United States
McLean Echlin
Affiliation:
University of California-Santa Barbara, Santa Barbara, California, United States
Jungho Shin
Affiliation:
Materials Department, UC Santa Barbara, Santa Barbara, California, United States
Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, California, United States
Marc De Graef
Affiliation:
Carnegie Mellon University, Pittsburgh, Pennsylvania, United States
Tresa Pollock
Affiliation:
University of California-Santa Barbara, Santa Barbara, California, United States
Daniel Gianola
Affiliation:
Materials Department, UC Santa Barbara, Santa Barbara, California, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1164 - 1165
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Copyright
Copyright © Microscopy Society of America 2020

References

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We acknowledge the financial support from the NSF MRSEC Program through DMR 1720256 (IRG-1). This material is based upon work supported by the U.S. Department of Energy, Office of Basic Energy Sciences, under Award Number DE-SC0019681. The research reported here made use of shared facilities of the UCSB MRSEC (NSF DMR 1720256), a member of the Materials Research Facilities Network (www.mrfn.org).Google Scholar