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Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells

Published online by Cambridge University Press:  22 July 2022

Michael Colletta ,
Yao Yang ,
Berit H. Goodge ,
Héctor D. Abruña  and
Lena F. Kourkoutis
Michael Colletta
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA
Yao Yang
Affiliation:
Department of Chemistry and Chemical Biology, Baker Laboratory, Cornell University, Ithaca, NY, USA
Berit H. Goodge
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell, Cornell University, Ithaca, NY, USA
Héctor D. Abruña
Affiliation:
Department of Chemistry and Chemical Biology, Baker Laboratory, Cornell University, Ithaca, NY, USA
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell, Cornell University, Ithaca, NY, USA

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2210 - 2212
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work was supported as part of the Center for Alkaline-based Energy Solutions (CABES), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences under Award # DE-SC0019445, and NSF (DMR-1429155, DMR-1719875).Google Scholar