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A Precision Signal Amplifier for Improved Imaging of Insulating Samples using Variable Pressure SEM

Published online by Cambridge University Press:  01 August 2005

W R Knowles ,
M Kliment  and
R Schroemges
W R Knowles
Affiliation:
FEI Company, Hillsboro, Oregon
M Kliment
Affiliation:
FEI Company, Hillsboro, Oregon
R Schroemges
Affiliation:
FEI Company, Hillsboro, Oregon

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 404 - 405
Copyright
© 2005 Microscopy Society of America